2009 IEEE  INTERNATIONAL SOI  CONFERENCE

5 - 8 October, 2009 Crowne Plaza Hotel Foster City, California  USA

3rd ANNUAL FUNDAMENTALS CLASS

"SOI Devices and Circuits"

  • Fundamentals of SOI MOSFETs: Scaling and Performance
    Yuan Taur, University of California, San Diego

  • Circuit Design with SOI
    Andrew Marshall, Texas Instruments Inc.

The SOI fundamental class is dedicated to attendees who want to get a basic knowledge of SOI MOSFET device physics and circuits design. Two lectures of 1.5 hours each will be given by world recognized experts in their respective fields, Professor Yuan Taur (University of California, San Diego) and Dr. Andrew Marshall (Texas Instruments). 

Professor Taur will cover the device fundamentals of SOI MOSFETs.  For any given technology node, CMOS performance is limited by the shortest channel length that can be made while maintaining robust 2-D electrostatic integrity.  The scale length theories for both partially depleted and fully-depleted SOI MOSFETs will be discussed in detail, leading to the guideline of minimum channel length as a function of the film thickness, with an emphasis on the important role of the backgate in scaling.  A two-region scale length model that takes both the vertical and the lateral fields into account is needed to deal with relatively thick, high-k gate dielectrics.  The course will give useful guidelines that, with quantum mechanical considerations, allow the projection of scaling limits for bulk, SOI, double-gate, and nanowire MOSFETs.

Dr. Marshall will speak on Circuit Design with SOI.  In some ways, circuit design in silicon-on-insulator processes varies significantly from that of conventional bulk silicon. In other aspects it can be very similar. This class will discuss the similarities and different aspects of circuit design for partially and fully depleted silicon on insulator technologies with planar and FinFET device types.

Following a brief overview of SOI Components and Device Properties, a comparison of SOI and Bulk advantages and disadvantages will be described as a way of selecting a process for a particular application. Discussion at this point covers MOS devices, Bipolar Transistors, Diodes and Passive Components. Logic, Memory and Analog Circuit Design in SOI are discussed, together with discussion of low power design and reliability issues.

FUNDAMENTALS CLASS CHAIR
Samuel Fung
TSMC
khfung@tsmc.com